15a-B-6 In Situ測定によるC60薄膜の電気物性評価と酸素の影響  [in Japanese] 15a-B-6 In Situ Measurement of Electrical Properties of C60 Thin Films and Oxygen Effects  [in Japanese]

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Journal

Abstracts of the meeting of the Physical Society of Japan. Sectional meeting   [List of Volumes]

Abstracts of the meeting of the Physical Society of Japan. Sectional meeting 1993(2), 404, 1993-09-20  [Table of Contents]

The Physical Society of Japan (JPS)

Codes

  • NII Article ID (NAID) :
    110001995898
  • NII NACSIS-CAT ID (NCID) :
    AN10453836
  • Text Lang :
    JPN
  • Databases :
    NII-ELS