15a-DH-7 オージェ電子回折、斜入射後方散乱中速電子回折によるAg/Si(111)√<3>×√<3>, Ag / Ge / Si(111)√<3>×√<3>表面構造解析  [in Japanese] 15a-DH-7 Structural analysis of Ag/Si(111)√<3>×√<3> and Ag / Ge / Si(111)√<3>×√<3> surface with Auger electron diffrsction and grazing incidence backscatering  [in Japanese]

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Journal

Abstracts of the meeting of the Physical Society of Japan. Sectional meeting   [List of Volumes]

Abstracts of the meeting of the Physical Society of Japan. Sectional meeting 1993(2), 557, 1993-09-20  [Table of Contents]

The Physical Society of Japan (JPS)

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  • NII Article ID (NAID) :
    110001996179
  • NII NACSIS-CAT ID (NCID) :
    AN10453836
  • Text Lang :
    JPN
  • Databases :
    NII-ELS