13p-PSB-9 Nondestractive Profiling and Distribution of Potential Using a Semiconductor Device as a Specimen

• TAKENOSHITA Hiroshi

  University of Osaka Prefecture

Bibliographic Information

Other Title

• 13p-PSB-9 半導体素子の非破壊・内部観察と動作状態電位分布

Journal

• Meeting Abstracts of the Physical Society of Japan

  Meeting Abstracts of the Physical Society of Japan 1993.2 (0), 630-, 1993

  The Physical Society of Japan

Details

• CRID: 1390001206160590080
• NII Article ID: 110001996293
• DOI: 10.11316/jpsgaiyoj.1993.2.0_630_1
• ISSN: 24331171
• Text Lang: ja
• Data Source:
  • JaLC
  • CiNii Articles