29aXD-2 イオンビームによる結晶 (c-Si) アモルファス化の解析  [in Japanese] An amorphizaion analysis of c-Si caused by ion beam irradiation  [in Japanese]

    • 中川 幸子
    • 岡理大院 Grad. School of Science, Okyama Univ. of Science
    • Betz G.
    • ウイーン工科大学 Institut fur Allgemeine Physik, Technical Univ.

Journal

Meeting abstracts of the Physical Society of Japan   [List of Volumes]

Meeting abstracts of the Physical Society of Japan 58(1-2), 162, 2003-03-06  [Table of Contents]

The Physical Society of Japan (JPS)

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Codes

  • NII Article ID (NAID) :
    110002213185
  • NII NACSIS-CAT ID (NCID) :
    AA11439205
  • Text Lang :
    JPN
  • ISSN :
    13428349
  • Databases :
    NII-ELS