7. STUDIES OF THE AMMON'S HORN SEIZURE WITH MICRO-ELECTRODE METHOD

    • OTSUKA R.
    • Department of Neuropsychiatry, School of Medicine, University of Kanazawa
    • KISHI Y.
    • Department of Neuropsychiatry, School of Medicine, University of Kanazawa
    • YOSHIMURA H.
    • Department of Neuropsychiatry, School of Medicine, University of Kanazawa
    • ONO H.
    • Department of Neuropsychiatry, School of Medicine, University of Kanazawa

    • MICHISHITA C.
    • Department of Neuropsychiatry, School of Medicine, University of Kanazawa
    • SHIMAZONO Y.
    • Department of Neuropsychiatry, School of Medicine, University of Kanazawa

Abstract

On the study of the behaviors of neurons during the appearance of evoked potential or seizure discharge in the Ammons horn produced by repetitive electrical stimulation, the following results are obtained:1. The unit discharges are roughly classified into three groups of 1) complete synchronous type, 2) incomplete synchronous type, and 3) indifferent type according to their synchronization with response-wave and seizure discharge, and in response-wave and seizure discharge alike, the percentages of the unit discharges in each type are approximate. Further, according to discharging frequency of unit spike, we get facilitation type, inhibition type, and indifferent type.2. On the second positive phase of the response-wave caused by repetitive electrical stimulation, there arise the gigantic spikes (G-spike) of 3-5msec. duration, and they appear as a negative-positive spikes at a shallow layer near the alveus, while as positive-negative biphasic ones near pyramidal cell layer. They arise spontaneously at the seizure discharge and show an extremely close relation with seizure.

Journal

Neurologia medico-chirurgica   [List of Volumes]

Neurologia medico-chirurgica 2(1-2), 89-95, 1960  [Table of Contents]

The Japan Neurosurgical Society

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Codes

  • NII Article ID (NAID) :
    110002280422
  • NII NACSIS-CAT ID (NCID) :
    AA0075470X
  • Text Lang :
    ENG
  • ISSN :
    04708105
  • Databases :
    NII-ELS  Journal@rchive