244 付加質量形AFMプローブの接触共振による微小領域弾性計測の高感度化(OS6-10 AFM・X線)(OS6 実験力学の新展開)  [in Japanese] 244 Sensitivity Enhancement for Measurement of Nano-scopic Elasticity Based on Contact Resonance of AFM Cantilever with a Concentrated Mass  [in Japanese]

Preview

Keywords

• Atomic Force Microscopy
• Contact Stiffness
• Cantilever
• Resonance
• Concentrated Mass

Codes

• NII Article ID (NAID) :

  110002486822

• NII NACSIS-CAT ID (NCID) :

  AA11902139

• Text Lang :

  JPN

• Databases :

  NII-ELS