1823 プリント基板検査システムの開発 : BGA の自動検査  [in Japanese] Development of Printed Circuit Board's Inspection-system : Automatic Inspection for BGA  [in Japanese]

Abstract

This paper describes the switching circuit to change the multi-electrode automatically by using the multiplexer and USB-Computer. It is possible to inspect BGA under various conditions by changing the range of sweep, interval of sampling time and partition value. All setting conditions are able to change by PC. PC is achieved to memorize the data from USB-Computer, and processing of these data. The switching circuit using USB-Computer worked to normal with BGA.

Journal

年次大会講演論文集 : JSME annual meeting   [List of Volumes]

年次大会講演論文集 : JSME annual meeting 2003(6), 219-220, 2003-08-05  [Table of Contents]

The Japan Society of Mechanical Engineers

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Codes

  • NII Article ID (NAID) :
    110002525971
  • NII NACSIS-CAT ID (NCID) :
    AA11461871
  • Text Lang :
    JPN
  • Databases :
    NII-ELS