1841 実験計画法を用いたパワー半導体熱シミュレーションモデルの検討  [in Japanese] Investigation of the Thermal Simulation Model of Power Semiconductor Device Using Design of Experiments  [in Japanese]

Abstract

In the development of a new switch mode power supply (SMPS), the detailed thermal assessment of the entire system is a very time-consuming and expensive process. Therefore, the development of an engineering tool that can drastically reduce both time and cost required by the development process is strongly desired. This paper describes the investigation of the thermal simulation model of power semiconductor devices using design of experiments.

Journal

年次大会講演論文集 : JSME annual meeting   [List of Volumes]

年次大会講演論文集 : JSME annual meeting 2003(6), 255-256, 2003-08-05  [Table of Contents]

The Japan Society of Mechanical Engineers

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Codes

  • NII Article ID (NAID) :
    110002525989
  • NII NACSIS-CAT ID (NCID) :
    AA11461871
  • Text Lang :
    JPN
  • Databases :
    NII-ELS