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- 後藤 芳彦
- 東北大学金属材料研究所
書誌事項
- タイトル別名
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- Epitaxial Growth and Growth Modes of Evaporated Films
抄録
In this report, especially focussed on the Stranski-Krastanov growth mode in growth of vacuum evaporated films, experimental evidences on epitaxy and growth modes for a Ag-Si (111) deposition system and some other systems are reviewed, which were obtained by techniques of RHEED, AES, TDS and SEM. By using RHEED, not only the ordered structures of two-dimensional adsorbed phase, but also epitaxial relation of three-dimensional crystallites can be known. The measurement of Auger amplitude versus coverage gives us reliable evidences on growth modes, and from this measurement the surface composition of the first monolayer can be determined. By the TDS measurement, it is possible to separate the evaporation of two-dimensional adsorbed phase from that of three-dimensional crystallites in different temperatures. By using UHV-SEM, in situ observation of growing crystallites on clean surface is possible.
収録刊行物
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- 日本結晶成長学会誌
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日本結晶成長学会誌 10 (3-4), 167-187, 1983
日本結晶成長学会
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詳細情報 詳細情報について
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- CRID
- 1390001205863250304
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- NII論文ID
- 110002773334
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- ISSN
- 21878366
- 03856275
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可