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Abstract
The magnetic properties and magnetoresistance of Fe_xCo_<1-x>-Al_2O_3 thin films were studied by changing the target-substrate distance (D_<T-S>) from 65 to 12 0mm. The films were prepared by rf magnetron sputtering. The MR ratio of Fe_<0.2>Co_<0.8>-Al_2O_3 thin films increased with increasing D_<T-S>. An MR ratio of 7.3% was obtained in a film with D_<T-S> of 120mm at room temperature. The MR ratio and the MR sensitivity of Fe_xCo_<1-x>-Al_20_3 thin films exhibited a maximum at about x=0.2. From an analysis of the structure, it is considered that the enhancement of the MR ratio is related to enlargement and small distriburion of the macroscopic grain size in the films.
Journal
- Journal of Magnetics Society of Japan [List of Volumes]
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Journal of Magnetics Society of Japan 23(4-2), 1333-1336, 1999-04-15 [Table of Contents]
The Magnetics Society of Japan (MSJ)