アモルファスワイヤC-MOS MIセンサ回路による渦電流型金属近接検出  [in Japanese] Proximity Sensing for Metals, Using an Amorphous Wire C-MOS MI Circuit  [in Japanese]

Abstract

This paper presents a new proximity sensing method for metals that uses a C-MOS IC MI sensor circuit with an amorphous wire head 30 μm in diameter and 1-2 mm in length with a coil. A sharp pules field with a rise time of a few nano seconds is generated from the amorphous wire by a coil current and the wire axis, and induces a field with an eddy current at the surface of a metal specimen. The new metal sensor with a micro-size head and quick response is expected to be useful for non-destructive testing (NDT) of micro region in metals.

Journal

Journal of Magnetics Society of Japan   [List of Volumes]

Journal of Magnetics Society of Japan 23(4-2), 1453-1456, 1999-04-15  [Table of Contents]

The Magnetics Society of Japan (MSJ)

References:  6

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Codes

  • NII Article ID (NAID) :
    110002810527
  • NII NACSIS-CAT ID (NCID) :
    AN0031390X
  • Text Lang :
    JPN
  • Article Type :
    ART
  • ISSN :
    02850192
  • NDL Article ID :
    4696494
  • NDL Source Classification :
    ZM35(科学技術--物理学)
  • NDL Call No. :
    Z15-398
  • Databases :
    CJP  NDL  NII-ELS