ECT技術によるプリント配線の欠陥検出の可能性  [in Japanese] Feasibility of Inspecting Defects in Printed Circuit Boards by Using Eddy-Current Testing Techniques  [in Japanese]

    • 宮腰 貴久 Miyagoshi T.
    • 金沢大学工学部附属電磁場制御実験施設 Laboratory of Magnetic Field Control and Applications, Faculty of Engineering, Kanazawa University
    • 山田 外史 Yamada S.
    • 金沢大学工学部附属電磁場制御実験施設 Laboratory of Magnetic Field Control and Applications, Faculty of Engineering, Kanazawa University
    • 岩原 正吉 Iwahara M.
    • 金沢大学工学部附属電磁場制御実験施設 Laboratory of Magnetic Field Control and Applications, Faculty of Engineering, Kanazawa University

Abstract

The inspection of etching defects in an as-made printed circuit boards (PCBs) is an attractive application of eddy-current testing (ECT) technology, since ECT inspection has various advantages such as non-contact, low stress, conductive testing, and fast scanning. When the technique is applied to high-density PCBs, the difference from conventional approaches becomes more remarkable. This paper describes the relationship between the shape of the inductive sensor and the width of printed wiring. The evaluation of signal-to-noise ratio results obtained by experiment clarifies the limits of detection. To improve inspection for higher-density PCBs requires a finer ECT sensor, but it was confirmed the defects in the printed wiring with a width less than one third of the sensor pitch can be detected.

Journal

Journal of Magnetics Society of Japan   [List of Volumes]

Journal of Magnetics Society of Japan 23(4-2), 1613-1616, 1999-04-15  [Table of Contents]

The Magnetics Society of Japan (MSJ)

References:  4

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Cited by:  6

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Codes

  • NII Article ID (NAID) :
    110002810567
  • NII NACSIS-CAT ID (NCID) :
    AN0031390X
  • Text Lang :
    JPN
  • Article Type :
    Journal Article
  • ISSN :
    02850192
  • NDL Article ID :
    4697034
  • NDL Source Classification :
    ZM35(科学技術--物理学)
  • NDL Call No. :
    Z15-398
  • Databases :
    CJP  CJPref  NDL  NII-ELS