A Worst-Case Optimization Approach with Circuit Performance Model Scheme
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- TAKAHASHI Masayuki
- Semiconductor Company, Sony Corporation
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- LU Jin-Qin
- Semiconductor Company, Sony Corporation
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- OGAWA Kimihiro
- Semiconductor Company, Sony Corporation
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- ADACHI Takehiko
- Faculty of Engineering, Yokohama National University
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抄録
In this paper, we describe a worst-case design optimization approach for statistical design of integrated circuits with a circuit performance model scheme. After formulating worst-case optimization to an unconstrained multi-objective function minimization problem, a new objective function is proposed to find an optimal point. Then, based on an interpolation model scheme of approximating circuit performance, realistic worst-case analysis can be easily done by Monte Carlo based method without increasing much the computational load. The effectiveness of the presented approach is demonstrated by a standard test function and a practical circuit design example.
収録刊行物
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- IEICE transactions on fundamentals of electronics, communications and computer sciences
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IEICE transactions on fundamentals of electronics, communications and computer sciences 78 (3), 306-313, 1995-03-25
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詳細情報 詳細情報について
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- CRID
- 1573668927146060416
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- NII論文ID
- 110003207473
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- NII書誌ID
- AA10826239
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- ISSN
- 09168508
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles