Two Dimensional Electric Field Measurement in Microstrip-Line Circuits by Coaxial-Type Probe

• HIRAOKA Takaharu

  Department of Electrical, Electronics and Information Engineering, Kanagawa University

• NEISHI Yoshiaki

  Department of Electrical, Electronics and Information Engineering, Kanagawa University

• ANADA Tetsuo

  Department of Electrical, Electronics and Information Engineering, Kanagawa University

• HSU Jui-Pang

  Department of Electrical, Electronics and Information Engineering, Kanagawa University

Abstract

A detailed investigation of the electromagnetic field distributions in high frequency printed circuits and high-speed interconnects is very useful for physical understanding, studies of electromagnetic coupling effects for EMC and EMI and for optimization of electromagnetic circuit designs. The aim of this paper is to show how to measure the electric field distributions in electromagnetic circuits. An electromagnetic analysis for microstrip-line circuits is carried out by using a finite-difference time domain technique and its measurement is carried out by using a small probe antenna. The measurement results are in fairly good agreement with those of the numerical analysis using the FDTD method. Thus, the measurement system offers a valid means for predictions in the theoretical analysis of more complicated discontinuity problems.

Journal

• IEICE, C

  IEICE, C 88 (1), 77-82, 2005-01-01

  The Institute of Electronics, Information and Communication Engineers

Keywords

• microwave
• FD-TD techniques
• probe field mapping
• coaxial probe
• microstrip-line
• measurement

Details

• CRID: 1573387452278296704
• NII Article ID: 110003215069
• NII Book ID: AA10826283
• ISSN: 09168524
• Text Lang: en
• Data Source:
  • CiNii Articles