Transient Scattering from Parallel Plate Waveguide Cavities

• OHNUKI Shinichiro

  Department of Electrical Engineering, College of Science and Technology, Nihon University

• HINATA Takashi

  Department of Electrical Engineering, College of Science and Technology, Nihon University

抄録

Transient scattering from parallel plate waveguide cavities is studied by using the combination of a point matching technique and numerical inversion of Laplace transform. We thoroughly investigate the scattering mechanism for a half-sine pulse and modulated-sine pulse incidence. The advantages and disadvantages on the target recognition are clarified in terms of the internal objects, incident waveforms, and polarizations.

収録刊行物

• IEICE transactions on electronics

  IEICE transactions on electronics 88 (1), 112-118, 2005-01-01

  一般社団法人電子情報通信学会

キーワード

• transient scattering
• waveguide
• cavity
• point matching technique
• Laplace transform

詳細情報

• CRID: 1571698602418033920
• NII論文ID: 110003215075
• NII書誌ID: AA10826283
• ISSN: 09168524
• 本文言語コード: en
• データソース種別:
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