遠紫外PESA法による有機EL材料の電子状態測定(分子薄膜デバイス・一般)  [in Japanese] Application of "Far Ultraviolet Photo-electron Spectroscopy in Air" to the OLED materials  [in Japanese]

Abstract

遠紫外照射光学系付きオープンカウンターを開発し、遠紫外大気中光電子分光法を行った。この装置は、7.00eVまでのエネルギーを持つフォトンで励起され、試料表面から放出された外殻電子を大気中で1つ1つ検出して計数することができる。この装置の性能を試すために、Hexaphenylcyclotrisiloxane (DPSiO_3)のイオン化ポテンシャルを測定したところ6.49eVであった。また、poly (9,9-dioctylfluorence) (F8)の状態密度を測定した。

A far ultraviolet photoelectron spectrometer equipped with the open counter was prepared, which can detect, in open-air, outer-orbital electrons excited by photons with energies up to 7.0 eV. Several OLED materials were employed to confirm performance of the spectrometer. The ionization potential of Hexaphenylcyclotrisiloxane (DPSiO3) is estimated to be 6.49eV. The near edge structure of poly (9,9-dioctylfluorence) (F8) was investigated by the spectrometer successfully.

Journal

Technical report of IEICE. OME   [List of Volumes]

Technical report of IEICE. OME 104(394), 1-4, 2004-10-22  [Table of Contents]

The Institute of Electronics, Information and Communication Engineers

References:  9

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Codes

  • NII Article ID (NAID) :
    110003301477
  • NII NACSIS-CAT ID (NCID) :
    AN10013334
  • Text Lang :
    JPN
  • Article Type :
    ART
  • ISSN :
    09135685
  • NDL Article ID :
    7153380
  • NDL Source Classification :
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No. :
    Z16-940
  • Databases :
    CJP  NDL  NII-ELS 

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