招待講演 交通システムにおける機構デバイスの信頼性 : 最近の障害例より(<特集>機構デバイスの信頼性,信頼性一般)  [in Japanese] Reliability of Electro-Mechanical Devices being used for the existing Transportation Systems : Through the recent Failures  [in Japanese]

Abstract

鉄道等の交通システムに使われる機構デバイスの現状を述べ、それらの主要な最近の障害例を通して、信頼性に関する問題点をあげている。

This paper deals with the Electro-Mechanical Devices being used for the existing Transportation Systems, and the problems concerning their reliability through the recent main failures.

Journal

IEICE technical report. Reliability   [List of Volumes]

IEICE technical report. Reliability 102(653), 1-4, 2003-02-14  [Table of Contents]

The Institute of Electronics, Information and Communication Engineers

References:  5

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Codes

  • NII Article ID (NAID) :
    110003301639
  • NII NACSIS-CAT ID (NCID) :
    AN10013243
  • Text Lang :
    JPN
  • Article Type :
    REV
  • ISSN :
    09135685
  • NDL Article ID :
    6506157
  • NDL Source Classification :
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No. :
    Z16-940
  • Databases :
    CJP  NDL  NII-ELS