A Knowledge Database on Thermal Control in Manufacturing Processes : Molding, Semiconductor Manufacturing, and Micro-Scale Manufacturing(<Special Issue>Emerging Fields in Thermal Engineering)

    • SATOH Isao
    • Department of Mechanical and Control Engineering, Tokyo Institute of Technology

Abstract

A prototype version of a knowledge database on thermal control in manufacturing processes, specifically, molding, semiconductor manufacturing, and micro-scale manufacturing has been developed. The knowledge database has search functions for technical data, evaluated benchmark data, academic papers, and patents. The database also displays trends and future roadmaps for research topics. It has quick-calculation functions for basic design. This paper summarizes present research topics and future research on thermal control in manufacturing engineering to collate the information to the knowledge database. In the molding process, the initial mold and melt temperatures are very important parameters. In addition, thermal control is related to many semiconductor processes, and the main parameter is temperature variation in wafers. Accurate in-situ temperature measurment of wafers is important. And many technologies are being developed to manufacture micro-structures. Accordingly, the knowledge database will help further advance these technologies.

Journal

JSME international journal. Ser. B, Fluids and thermal engineering   [List of Volumes]

JSME international journal. Ser. B, Fluids and thermal engineering 46(4), 510-518, 2003-11-15  [Table of Contents]

The Japan Society of Mechanical Engineers

References:  29

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Codes

  • NII Article ID (NAID) :
    110003479179
  • NII NACSIS-CAT ID (NCID) :
    AA10888815
  • Text Lang :
    ENG
  • Article Type :
    REV
  • ISSN :
    13408054
  • NDL Article ID :
    6745042
  • NDL Source Classification :
    ZN11(科学技術--機械工学・工業)
  • NDL Call No. :
    Z53-Y271
  • Databases :
    CJP  NDL  NII-ELS  J-STAGE