液晶における表面配向力と配向秩序度の関係  [in Japanese] Relation Between Anchoring Strength And Surface Alignment Order In A Liquid Crystal Cell  [in Japanese]

    • 宣 麗 Xuan L.
    • 東北大学大学院工学研究科電子工学専攻 Tohoku University Department of Electronics, Graduate school of Engineering
    • 上野 弘 Ueno H.
    • 東北大学大学院工学研究科電子工学専攻 Tohoku University Department of Electronics, Graduate school of Engineering
    • 宮下 哲哉 Miyashita T.
    • 東北大学大学院工学研究科電子工学専攻 Tohoku University Department of Electronics, Graduate school of Engineering

    • 内田 龍男 Uchida T.
    • 東北大学大学院工学研究科電子工学専攻 Tohoku University Department of Electronics, Graduate school of Engineering

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Abstract

液晶セルにおける表面配向のアンカリングの発生機構については十分に解明されていない。本研究では平均場理論に基づいて、配向秩序度を弾性定数と結びつけ、表面アンカリングの発生機構の解明を試みた。この結果、配向膜は数nmの厚さの範囲の液晶層の配向秩序度を変化させ、弾性定数を変化させている。これによって生じた容易軸からのずれにより実効的な配向力(アンカリング強度)の大きさが決まることが明らかにした。また、これによりS字形のねじれ配向分布を導出でき、この結果、従来測定していた配向力(アンカリング強度)は実効的な配向力であることを理論的に示すと共にこの関係を実験によってはじめて実証した。

The anchoring mechanism at the surface has not been completely clarified, yet. In this work, the relation between order parameter of the alignment and the elastic constant based on the mean field theory was used to analyze the surface anchoring mechanism. The result indicates that the alignment surface affects several nm into the liquid crystal layer where the order parameter is changed and it causes the change of the elastic constant. From this result, S shaped distribution of the director in a twist alignment was deduced. This distribution suggests that the anchoring strength measured until now is the effective anchoring strength. The theoretical analysis was proved firstly by a good agreement between the experimental and calculated results.

Journal

ITE Technical Report   [List of Volumes]

ITE Technical Report 22(35), 43-48, 1998-06-25  [Table of Contents]

The Institute of Image Information and Television Engineers

References:  10

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Codes

  • NII Article ID (NAID) :
    110003689947
  • NII NACSIS-CAT ID (NCID) :
    AN1059086X
  • Text Lang :
    JPN
  • Article Type :
    ART
  • ISSN :
    13426893
  • Databases :
    CJP  NII-ELS