Shadow-Projection X-Ray Microtomography for Line-Like Objects

• Aoki Sadao

  Institute of Applied Physics, University of Tsukuba

• Oshiba Mitsuo

  Olympus Optical Co.

• Kagoshima Yasushi

  Institute of Applied Physics, University of Tsukuba

抄録

An X-ray microtomographic system for line-like objects has been constructed with a conventional microfocus X-ray generator. A relatively high resolution (∼10 μm) has been attained. The enhancement of the image contrast has been demonstrated by utilizing the absorption edge of the sample.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 27 (9), 1784-1785, 1988

  社団法人応用物理学会

キーワード

• X-ray microtomography
• resolution
• shadow projection
• reconstruction
• CCD
• absorption edge
• absorption coefficient

詳細情報

• CRID: 1573950402130351104
• NII論文ID: 110003908343
• NII書誌ID: AA10457675
• ISSN: 00214922
• Web Site: https://jlc.jst.go.jp/DN/JALC/00337515819?from=CiNii
• 本文言語コード: en
• データソース種別:
  • CiNii Articles