Photo-Induced Current Transient Spectroscopy in High-Resistivity Bulk Material. I. Computer Controlled Multi-Channel PICTS System with High-Resolution

• Yoshie Osamu

  Department of Electronics, Kogakuin University

• Kamihara Mitsuo

  Department of Electronics, Kogakuin University

抄録

A computer controlled multi-channel PICTS system which allows one to detect many deep trapping levels in high-resistivity bulk material by only a single thermal scanning process, has been developed. In order to obtain the normalized PICTS signal, an automatic gain controlled pre-amplifier has been used. An expanded-scale technique which allows one to distinguish fine PICTS peaks has been proposed. This expanded-scale technique is very useful especially for the case when many PICTS peaks are closely superposed. In high-resistivity bulk CdS single crystal, it has been found that PICTS spectrum-shape and number of detected peaks depend strongly upon the wavelength of exciting laser light, and that the trap-parameters obtained are not strongly influenced by light intensity. The PICTS method may be superior on many points, especially in peak-separation, to the thermally stimulated current method.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 22 (4), 621-628, 1983

  社団法人応用物理学会

詳細情報

• CRID: 1571135652363317888
• NII論文ID: 110003909710
• NII書誌ID: AA10457675
• 本文言語コード: en
• データソース種別:
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