Negative Differential Resistance of CaF<sub> 2</sub>/CdF<sub> 2</sub> Triple-Barrier Resonant-Tunneling Diode on Si(111) Grown by Partially Ionized Beam Epitaxy
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- Watanabe Masahiro
- Research Center for Quantum Effect Electronics, Tokyo Institute of Technology, 2–12–1 O–okayama, Meguro–ku, Tokyo 152–8552, Japan
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- Aoki Yuichi
- Research Center for Quantum Effect Electronics, Tokyo Institute of Technology, 2–12–1 O–okayama, Meguro–ku, Tokyo 152–8552, Japan
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- Saito Wataru
- Department of Electrical and Electronics Engineering, Tokyo Institute of Technology, 2–12–1 O–okayama, Meguro–ku, Tokyo 152–8552, Japan
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- Tsuganezawa Mika
- Research Center for Quantum Effect Electronics, Tokyo Institute of Technology, 2–12–1 O–okayama, Meguro–ku, Tokyo 152–8552, Japan
書誌事項
- タイトル別名
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- Negative Differential Resistance of CaF2/CdF2 Triple-Barrier Resonant-Tunneling Diode on Si(111) Grown by Partially Ionized Beam Epitaxy.
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抄録
Room-temperature negative differential resistance (NDR) of triple-barrier cadmium di-fluoride (CdF2)/calcium di-fluoride (CaF2) heterostructure resonant-tunneling diode (RTD) on a Si(111) substrate has been demonstrated. CdF2/CaF2 multilayered heterostructures were grown on a Si(111) substrate using partially ionized beam epitaxy to obtain atomically flat interfaces. The RTD structures, which consist of triple CaF2 energy barriers and double CdF2 quantum wells, were fabricated by electron beam (EB) lithography and dry etching to avoid thermal and chemical damage to the CdF2 layers. In the current-voltage characteristics of the RTD, NDR was clearly observed even at room temperature and the maximum peak-to-valley (P/V) ratio was about 6.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 38 (2A), L116-L118, 1999
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206252045440
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- NII論文ID
- 110003921135
- 210000046320
- 130004525931
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
- http://id.crossref.org/issn/13474065
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- NDL書誌ID
- 4722481
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可