DC-Bias-Field-Induced Dielectric Relaxation in Antiferroelectric Phase of TFMHPOBC

  • Moritake Hiroshi
    Department of Electronic Engineering, Faculty of Engineering, Osaka University
  • Ozaki Masanori
    Department of Electronic Engineering, Faculty of Engineering, Osaka University
  • Yoshino Katsumi
    Department of Electronic Engineering, Faculty of Engineering, Osaka University

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Abstract

Dielectric properties in TFMHPOBC (4-(1,1,1-trifluoromethyl-heptyloxycarbonyl) phenyl 4′-octyloxybiphenyl-4-carboxylate) have been investigated as functions of temperature and dc bias field. In the antiferroelectric phase under no bias field, relaxation due to the soft mode and molecular rotation around the short axis are observed. Under dc bias field, a new relaxation is observed in chiral smectic CA (Sm CA*). The dielectric strength of this relaxation depends on the bias field, while the relaxation frequency is not affected by the dc bias field.

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Details 詳細情報について

  • CRID
    1570854177335750400
  • NII Article ID
    110003924263
  • NII Book ID
    AA10650595
  • Text Lang
    en
  • Data Source
    • CiNii Articles

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