DC-Bias-Field-Induced Dielectric Relaxation in Antiferroelectric Phase of TFMHPOBC
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- Moritake Hiroshi
- Department of Electronic Engineering, Faculty of Engineering, Osaka University
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- Ozaki Masanori
- Department of Electronic Engineering, Faculty of Engineering, Osaka University
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- Yoshino Katsumi
- Department of Electronic Engineering, Faculty of Engineering, Osaka University
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Abstract
Dielectric properties in TFMHPOBC (4-(1,1,1-trifluoromethyl-heptyloxycarbonyl) phenyl 4′-octyloxybiphenyl-4-carboxylate) have been investigated as functions of temperature and dc bias field. In the antiferroelectric phase under no bias field, relaxation due to the soft mode and molecular rotation around the short axis are observed. Under dc bias field, a new relaxation is observed in chiral smectic CA (Sm CA*). The dielectric strength of this relaxation depends on the bias field, while the relaxation frequency is not affected by the dc bias field.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 32 (10), L1432-L1435, 1993
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1570854177335750400
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- NII Article ID
- 110003924263
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- NII Book ID
- AA10650595
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- Text Lang
- en
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- Data Source
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- CiNii Articles