Fluctuation-Free Electron Emission from Non-Formed Metal-Insulator-Metal (MIM) Cathodes Fabricated by Low Current Anodic Oxidation

• Toshiaki Kusunoki

• Mutsumi Suzuki

• Susumu Sasaki

• Tomio Yaguchi Tomio Yaguchi

• Toshiyuki Aida Toshiyuki Aida

抄録

Fluctuation-free electron emission is obtained from MIM (Al-Al 2 O 3 -Au) cathodes. The Al 2 O 3 layer is fabricated by anodic oxidation with a reduced electrolysis current density, i.e., a reduced oxidation rate. The slow oxidation process improves the insulating effect of the Al 2 O 3 layer, and enables the MIM cathodes to operate in the non-formed state. The fluctuation-free emission is reproducible when the diode voltage is cut off instantaneously. With a thin Al 2 O 3 layer, the diode voltage reguired for the cathode operation is reduced to values slightly above the work function of the top electrode.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 32 (11B), L1695-, 1993-11-01

  IOP Publishing

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1360566396795664384
• NII論文ID: 110003924294
• NII論文ID: 210000034726
• NII書誌ID: AA10650595
• DOI: 10.1143/jjap.32.l1695
• ISSN: 13474065
• ISSN: 00214922
• ISSN: http://id.crossref.org/issn/00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.32.L1695
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.32.L1695/pdf
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