Study on the Si(111)\sqrt3×\sqrt3–Ag Surface Structure by X-Ray Diffraction

• Takahashi Toshio

  Institute for Solid State Physics, University of Tokyo

• Nakatani Shinichiro

  Institute for Solid State Physics, University of Tokyo

• Okamoto Naoko

  Institute for Solid State Physics, University of Tokyo

• Ishikawa Tetsuya

  Photon Factory, National Laboratory for High Energy Physics

• Kikuta Seishi

  Department of Applied Physics, Faculty of Engineering, University of Tokyo

抄録

The surface structure of Si(111)\sqrt3×\sqrt3–Ag has been analyzed from the X-ray intensity versus energy curves measured both for the integral- and fractional-order spots. A modified trimer model with three Ag atoms in the \sqrt3×\sqrt3 unit cell is proposed, in which triangles made of Ag atoms are chained in a honeycomb arrangement. The distances between the nearest neighbor Ag atoms are about twice the van der Waals radius. The height of the Ag layer measured from the ideal first Si layer is 2.9±0.1 A. The center of each triangle coincides with the position of the honeycomb protrusion observed by scanning tunneling microscopy.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 27 (5), L753-L755, 1988

  社団法人応用物理学会

キーワード

• surface structure
• structure analysis
• silicon
• silver
• X-ray diffraction
• synchrotron radiation
• van der Waals radius

詳細情報

• CRID: 1570572702360808064
• NII論文ID: 110003928103
• NII書誌ID: AA10650595
• 本文言語コード: en
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