Basic Control Characteristics of Novel Schottky In-Plane and Wrap Gate Structures Studied by Simulation and Transport Measurements in GaAs and InGaAs Quantum Wires.
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- Okada Hiroshi
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060, Japan
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- Kasai Seiya
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060, Japan
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- Fujikura Hajime
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060, Japan
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- Hashizume Tamotsu
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060, Japan
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- Hasegawa Hideki
- Research Center for Interface Quantum Electronics and Graduate School of Electronics and Information Engineering, Hokkaido University, Sapporo 060, Japan
書誌事項
- タイトル別名
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- Basic Control Characteristics of Novel
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To clarify the control properties of Schottky in-plane gates (IPGs) and Schottky wrap-gates (WPGs) recently employed in the high-temperature operation of compound semiconductor single electron devices, computer simulations and transport measurements were carried out for gated quantum wires (QWRs). Both types of QWRs showed clear Shubnikov-de Haas oscillations. Non-linear Landau plots confirmed gate-controlled 1D transport in the QWRs. In the GaAs IPG QWR, the effective wire width was found to change linearly with gate bias, whereas this was not observed in the InGaAs WPG QWR. These gate control behaviors are in excellent agreement with theory. Near pinch-off, clear conductance oscillation was seen in both QWRs.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 36 (6B), 4156-4160, 1997
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681225134592
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- NII論文ID
- 210000041394
- 110003947140
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- NII書誌ID
- AA10457675
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4260238
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可