ホールドとスイッチの機能を考慮した内部平衡構造  [in Japanese] Internally balanced structure with hold and switching functions  [in Japanese]

本稿では,ホールドとスイッチの機能を考慮して,内部平衡構造を拡張した順序回路のクラスである内部切替平衡構造を提案する.提案するクラスは,組合せテスト生成複雑度でテスト生成可能であり,平衡構造,内部平衡構造,切替平衡構造の順序回路のクラスを真に含む.本稿では,内部切替平衡構造順序回路に対して,(1)組合せ論理部の故障に対して組合せテスト生成複雑度でテスト生成可能であることを示し,(2)ホールドレジスタおよびスイッチの故障に対して検出可能となるための十分条件と故障検出率の実験的評価を示し,(3)計算量に基づく組合せテスト生成複雑度に関して考察する.

In this paper, we introduce a class of sequential circuits with internally switched balanced structures. The proposed structure is an extension of both internally balanced structure and switched balanced structure by considering hold and switching functions. This class properly includes classes of sequential circuits with balanced structures, internally balanced structures, and switched balanced structures, which are classes of sequential circuits with a combinational test generation complexity. In this paper, we show, for the internally switched balanced structures, (1) they allow test, generation wit,h combinational test generation complexity for faults in combinational logic blocks, (2) sufficient conditions for faults in hold registers and switches to be detectable, and experimental results on fault coverages on these faults, and (3) consideration for combinational test generation complexity based on time complexity.