Structural Analysis of Ag-In-Sb-Te Phase-Change Material.

DOI Web Site 被引用文献5件 参考文献3件
  • Tashiro Hiroko
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Harigaya Makoto
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Kageyama Yoshiyuki
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Ito Kazunori
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Shinotsuka Michiaki
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Tani Katsuhiko
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Watada Atsuyuki
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Yiwata Noriyuki
    Research and Development Center, Ricoh Company Ltd., 16-1 Shinei-cho, Tsuzuki-ku, Yokohama 224-0035, Japan
  • Nakata Yoshiyuki
    Iwaki Meisei University, Iwaki, Fukushima 970-8551, Japan
  • Emura Shuichi
    ISIR, Osaka University, Ibaraki, Osaka 567-0047, Japan

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The Ag-In-Sb-Te system is widely used for phase-change discs such as compact disc rewritable (CD-RW) and rewritable digital versatile disc (DVD+RW). To clarify the effect of Ag and In in the Ag-In-Sb-Te system, we studied the local structure of Ag-In-Sb-Te phase-change material by extended X-ray absorption fine structure (EXAFS). The results suggest that the existence of Ag contributes to the thermal stability of amorphous marks and existence of In contributes to high-speed phase-change.

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