Blue-Emitting Eu〔2+〕-Doped CaAl2O4 Phosphor Thin Films Prepared Using Pulsed Laser Deposition Technique with Post Annealing
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- Kunimoto Takashi
- Department of Electrical and Electronic Engineering, Tottori University, Koyama, Tottori 680-8552, Japan
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- Kakehi Ken-nosuke
- Department of Electrical and Electronic Engineering, Tottori University, Koyama, Tottori 680-8552, Japan
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- Yoshimatsu Ryo
- Department of Electrical and Electronic Engineering, Tottori University, Koyama, Tottori 680-8552, Japan
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- Ohmi Koutoku
- Department of Electrical and Electronic Engineering, Tottori University, Koyama, Tottori 680-8552, Japan
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- Tanaka Shosaku
- Department of Electrical and Electronic Engineering, Tottori University, Koyama, Tottori 680-8552, Japan
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- Kobayashi Hiroshi
- Department of Electrical and Electronic Engineering, Tottori University, Koyama, Tottori 680-8552, Japan
書誌事項
- タイトル別名
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- Blue-Emitting Eu2+-Doped CaAl2O4 Phosphor Thin Films Prepared Using Pulsed Laser Deposition Technique with Post Annealing.
- Blue-Emitting Eu<sup>2+</sup>-Doped CaAl<sub>2</sub>O<sub>4</sub> Phosphor Thin Films Prepared Using Pulsed Laser Deposition Technique with Post Annealing
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抄録
Blue-emitting Eu2+-doped calcium aluminate phosphor thin films were obtained using the pulsed laser deposition technique with post annealing. As-deposited films were amorphous and showed weak red Eu3+ photoluminescence (PL). By annealing in reducing atmosphere (N2/H2:2% mixed gas) at 950°C for 3 h, the film was crystallized and showed a PL emission band peaking at about 447 nm, which originated from the 4f65d to 4f7 transition of Eu2+ ion. It is considered that the deposited film consists mainly of CaAl2O4 and partly of other binary compounds of the CaO-Al2O3 system. It was determined that the PL intensity of Eu2+ in CaAl2O4 can be controlled by the laser fluence, target-substrate distance and injection gas.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 40 (10B), L1126-L1128, 2001
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681227925888
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- NII論文ID
- 210000050505
- 110004085407
- 130004527997
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 5940642
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可