A simulation code for the infrared whole sky survey with the Far-Infrared Surveyor(FIS) on board ASTRO-F

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ASTRO-F is the second Japanese infrared space mission to be launched in early 2004. One of its focal-plane instruments, the Far-Infrared Surveyor (FIS), will carry out the whole sky survey in four-wavelength bands ranging from 50 to 200 μm. To evaluate the instrument performance and to prepare the data reduction system prior to the launch, we have developed a program to simulate the ASTRO-F/FIS sky survey, considering the basic instrumental proerties such as the diffraction pattern of the telescope, the detector pixel shape, and the readout electronics. In this paper, we focus on the validation of the hardware design of two long-wavelength (LW) bands covering 110-200 μm and 150-200μm. The stressed Ge:Ga detector arrays of 3x5 and 2x15 pixels are used for these two LW bands, respectively, In order to improve he spatial sampling frequency in the cross-scan direction, we tilted the FIS detector arrays by 26.5 degrees with respect to the scan direction. We demonstrate that this configuration actually provides better spatial information in the cross-scan direction. We evaluate the effective resolution of the FIS for the object with the different spectral energy distributions (SEDs). Since the full width at half maximum (FWHM) and the peak power of the images of point sources change significantly depending on the wavelength, color correction should be considered especially for the wide band in the data reduction processes. We scan a point ource locating at different relative positions from the scanning path, and examine how well we can determine the position and the power of the source. We assume an ideal situation; no noise, constant background, and monochromatic light. We find that fitting by the point spread function (PSF) is indispensable for the accurate measurement of the source flux and position. Since PSF changes with the color of the object, the shape of the PSF itself would be a fitting parameter. We find that second scan improves the reliability of the PSF fit.

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詳細情報 詳細情報について

  • CRID
    1572824502133063168
  • NII論文ID
    110006251670
  • NII書誌ID
    AA10632072
  • ISSN
    02856808
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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