Development of Time-Resolved Scanning Tunneling Microscopy in Femtosecond Range.

• Takeuchi Osamu

  Institute of Applied Physics, CREST, University of Tsukuba, Tsukuba 305-8573, Japan

• Morita Ryuji

  Department of Applied Physics, CREST, Hokkaido University, Sapporo 060-8628, Japan

• Yamashita Mikio

  Department of Applied Physics, CREST, Hokkaido University, Sapporo 060-8628, Japan

• Shigekawa Hidemi

  Institute of Applied Physics, CREST, University of Tsukuba, Tsukuba 305-8573, Japan

抄録

A promising design for achieving the ultimate spatial and temporal resolution is proposed. With modulation of the time delay between two femtosecond laser pulses repeatedly illuminating a scanning tunneling microscope junction, the induced component of the tunneling current is detected as a function of the delay time. With this method, a high signal-to-noise ratio, stable measurement free from fluctuation of laser intensity, and removal of the thermal expansion effect can be achieved. Using the photovoltage effect of GaAs, the high performance of the newly developed system is demonstrated in the femtosecond range.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 41 (7B), 4994-4997, 2002

  The Japan Society of Applied Physics

キーワード

• scanning tunneling microscopy
• temporal resolution
• femtosecond laser

詳細情報

• CRID: 1390282681233059840
• NII論文ID: 210000051838
• NII論文ID: 110006341657
• NII書誌ID: AA10457675
• DOI: 10.1143/jjap.41.4994
• ISSN: 13474065
• ISSN: 00214922
• NDL書誌ID: 6255830
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6255830
• Web Site: http://stacks.iop.org/1347-4065/41/i=7S/a=4994/pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可