Studies of a Reactive Sputter Ion Plating for Preparation of TiN Films Using a Facing Target Sputter and Immersed Inductive Coupled Plasma Source

    • SUNG Youl-Moon
    • Department of Electrical Electronic Engineering, Miyazaki University
    • OTSUBO Masahisa
    • Department of Electrical Electronic Engineering, Miyazaki University
    • HONDA Chikahisa
    • Department of Electrical Electronic Engineering, Miyazaki University
    • PARK Chung-Hoo
    • Department of Electrical Engineering, Pusan National University

Abstract

A new type of sputter ion plating system with facing target sputter and immersed inductive coupled plasma (ICP) source was developed for hard coating of metals and various compound materials. The precise control of plasma conditions, such as ion bombardment energy and electron properties, was very important for high-quality film formation. The electron density (n_e) of l0^<10>-l0^<12> cm^<-3> was obtained in the discharge region, and the electron temperature (T_e) was in the range of 2.5-5.7 eV. The adhesive force of the TiN film prepared by this system on the stainless steel substrate was in the range of 20-50 N in the scratch test. The mechanical characteristics of TiN film such as adhesion and hardness almost completely depend on the ion energy incident onto the substrate, whereas the reactivity has a deep correlation with the density of RF plasma.

Journal

Japanese journal of applied physics. Pt. 1, Regular papers & short notes   [List of Volumes]

Japanese journal of applied physics. Pt. 1, Regular papers & short notes 41(11A), 6563-6569, 2002-11-15  [Table of Contents]

The Japan Society of Applied Physics

References:  17

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Codes

  • NII Article ID (NAID) :
    110006341984
  • NII NACSIS-CAT ID (NCID) :
    AA10457675
  • Text Lang :
    ENG
  • Article Type :
    ART
  • Journal Type :
    大学紀要
  • ISSN :
    0021-4922
  • NDL Article ID :
    6358735
  • NDL Source Classification :
    ZM35(科学技術--物理学)
  • NDL Call No. :
    Z53-A375
  • Databases :
    CJP  NDL  NII-ELS  JSAP/JPS