10keV X-Ray Phase-Contrast Microscopy for Observing Transparent Specimens.

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  • Kagoshima Yasushi
    Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
  • Ibuki Takashi
    Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
  • Yokoyama Yoshiyuki
    Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
  • Tsusaka Yoshiyuki
    Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
  • Matsui Junji
    Faculty of Science, Himeji Institute of Technology, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan
  • Takai Kengo
    Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Mikazuki, Sayo, Hyogo 679-5198, Japan
  • Aino Masataka
    Hyogo Prefectural Agricultural Institute, Befu, Kasai, Hyogo 679-0198, Japan

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Hard X-ray phase-contrast microscopy has been performed with phase plates of tantalum using an X-ray beam from an undulator in SPring-8. The photon energy was set at 10 keV near the L3 absorption edge of tantalum (9.9 keV) in order to increase the phase contrast. To demonstrate its capability, a transparent specimen was imaged clearly in the reverse contrast with phase plates to shift the phase by one-quarter and three-quarters of a period, while conventional absorption imaging showed little contrast. Further, an image contrast as high as approximately 40% can be obtained for the cell walls of another specimen.

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