3-15 マイクロプロセッサ制御ファブリ・ぺロー干渉計を用いた層状半導体のブリルアン散乱(一般講演)  [in Japanese] 3-15 Brillouin Scattering in Layered Semiconductors by using Microprocessor-controlled Fabry-Perot Interferometer  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (1), 137-138, 1980-12-15  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007459604
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS