E-2 波形形状の変化による欠陥種類の判別(一般講演)  [in Japanese] E-2 Disctimination of the Defects by the change of wave Shape  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (2), 83-84, 1981-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007459649
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS