E-10 超音波顕微鏡による固体表面下の欠陥の観察(一般講演)  [in Japanese] E-10 Observation of Subsurface Flaws of Solids with Scanning Acoustic Microscope  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (2), 99-100, 1981-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007459657
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS