C-3 漏洩導波路からの放射と結合効率(表面波伝搬とデバイスI)  [in Japanese] C-3 Radiation pattern from leaky SAW waveguide and the Coupling efficency  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (3), 83-84, 1982-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007459726
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS