B-6 ピッチ・キャッチ法による円柱状欠陥の測定(基礎・計測II)  [in Japanese] B-6 Measurement of Cylindrical Flaws by the Pitch-Catch Method  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (4), 61-62, 1983-12-06  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007459781
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS