A-9 電子線超音波顕微鏡によるトランジスタ内の転位線の観察(基礎・計測III)  [in Japanese] A-9 Some observation of dislocation lines in a transistor by electron-acoustic microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (5), 19-20, 1984-12-04  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007459827
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS