P-33 光・熱放射法による半導体材料の非破壊非接触評価(ポスター・セッション) [in Japanese] P-33 Nondestructive and Noncontact Evaluation of Semiconductors by Photothermal Radiometry [in Japanese]

- 中村弘通 Nakamura Hiromichi
- 東北大学電気通信研究所 Research Institute of Electrical Communication, Tohoku University
- 坪内和夫 Tsubouchi Kazuo
- 東北大学電気通信研究所 Research Institute of Electrical Communication, Tohoku University
- 御子柴宣夫 Mikoshiba Nobuo
- 東北大学電気通信研究所 Research Institute of Electrical Communication, Tohoku University

Read/Search this Article

Journal

Symposium on ultrasonic electronics [List of Volumes]

Symposium on ultrasonic electronics (5), 111-112, 1984-12-04 [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Codes

NII Article ID (NAID) :
110007459872
NII NACSIS-CAT ID (NCID) :
AN10578660
Text Lang :
JPN
Databases :

NII-ELS