E-3 弾性表面波デバイスの温度特性に対する表面の電気的摂動の影響(弾性表面波とデバイスI)  [in Japanese] E-3 Effects of Electrical Perturbation on TCD of SAW Devices  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (5), 117-118, 1984-12-04  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007459875
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS