F-3 電子線超音波顕微鏡(EAM)による試料内部の観察範囲(音響顕微鏡)  [in Japanese] F-3 Depth directional study by an electron-acoustic microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (7), 169-170, 1986-12-08  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

Preview

Preview

Codes

  • NII Article ID (NAID) :
    110007460043
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS