I-1 光音響法並びに光・熱放射法による半導体中の非発光過程と欠陥の研究(招待講演)  [in Japanese] I-1 Investigation of Nonradiative Processes and Defects in Semiconductors by Photoacoustic and Photo-Thermal-Radiation Techniques  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (8), 25-26, 1987-12-08  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460057
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS