E-8 電子線超音波顕微鏡像のコントラスト : バイアスを印加したSi・Tr-chipの場合(顕微鏡・光音響)  [in Japanese] E-8 Contrast of the Image of Electron-Acoustic Microscopy : The Case of Si Tr-Chip under Condition of Bias Application  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (8), 147-148, 1987-12-08  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460116
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS