E-8 V(z)曲線法による膜の密着性評価(超音波顕微鏡)  [in Japanese] E-8 Evaluation of adhesion of films by V(z) method  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (9), 159-160, 1988-12-07  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460214
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS