PB6 差動型光熱偏向分光法による半導体の光学的・熱的評価(ポスターセッション概要講演)  [in Japanese] PB6 Optical and Thermal Evaluation of Semiconductor by Differential Photothermal Deflection Spectroscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (12), 65-66, 1991-12-02  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460264
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS