PC16 差分PPE法による半導体の熱拡散率の測定(ポスターセッション概要講演)  [in Japanese] PC16 Thermal Diffusivity of Semiconductors Evaluated by Differential PPE Method  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (12), 141-142, 1991-12-02  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460302
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS