PA22 純銅と真ちゅうのX線光音響信号の試料厚依存性(ポスターセッションA)  [in Japanese] PA22 Dependence of the X-ray Photoacoustic Signal Intensity of Pure Copper and Brass on Sample Thickness  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (13), 75-76, 1992-11-30  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460475
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS