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Abstract
We present measurements with a new optical technique for the detection of picosecond ultrasonic pulses in thin opaque films by direct time-resolved detection of ultrafast vibrations of the film surface. For thin films of tungsten and a three-layer Cr/a-Si/W sample we show how the strain pulse shape in the film can be measured without significant distortion at frequencies around 100 GHz.
Journal
- Symposium on ultrasonic electronics [List of Volumes]
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Symposium on ultrasonic electronics (13), 121-122, 1992-11-30 [Table of Contents]
Steering committee of symposium on ultrasonic electronics