E1 ULTRASONIC DETECTION FROM PICOSECOND SURFACE VIBRATIONS

Abstract

We present measurements with a new optical technique for the detection of picosecond ultrasonic pulses in thin opaque films by direct time-resolved detection of ultrafast vibrations of the film surface. For thin films of tungsten and a three-layer Cr/a-Si/W sample we show how the strain pulse shape in the film can be measured without significant distortion at frequencies around 100 GHz.

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (13), 121-122, 1992-11-30  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460498
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    ENG
  • Databases :
    NII-ELS