E2 原子間力顕微鏡におけるインピーダンスによる力検出方法(測定技術)  [in Japanese] E2 Novel method for detecting forces in atomic force microscopy  [in Japanese]

Journal

Symposium on ultrasonic electronics   [List of Volumes]

Symposium on ultrasonic electronics (13), 123-124, 1992-11-30  [Table of Contents]

Steering committee of symposium on ultrasonic electronics

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Codes

  • NII Article ID (NAID) :
    110007460499
  • NII NACSIS-CAT ID (NCID) :
    AN10578660
  • Text Lang :
    JPN
  • Databases :
    NII-ELS